NenoVision develops, manufactures, and sells a revolutionary type of atomic force microscope (AFM) LiteScope™ designed for fast and easy integration into scanning electron microscopes (SEMs).
Apart of selling LiteScope, our AFM designed for integration into SEM, we also offer its rental to customers. We also provide trainings in correlative microscopy, measurements of customer samples (Topography and surface roughness, Energy dissipation, FMM, F-z curves, nanoindentation C-AFM, C-CPEM, KPFM, PFM, I-V spectroscopy, STM, MFM) or specific research on demand.
Main areas of research and development
Our development is focused to instrument and applications related to AFM in SEM. We are interested and active in development of techniques related to correlative imaging, utilization of artifical inteligence in microscopy and development of new techniques for surface charactarisation using AFM in SEM. Our application focus is mainly in areas of materiál science, nanostructures, semiconductors and life science.
Special facilities (které můžete nabídnout ke kooperaci)
Litescope, Atomic Force Microscope designed for easy integration into the Scanning Electron Microscopes. It’s compatible with most of SEMs and serves of in-situ correlative analysis of nanostructures. The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques.
LiteScope – AFM for SEM
Explore CPEM – the only true correlative microscopy