On May 28, 2025, the Faculty of Science at Palacký University in Olomouc hosted a professional workshop titled “Advanced Technologies in Scanning Electron Microscopy (SEM) in Materials Science and Data Correlation for Deeper Analysis”, organized in collaboration with ZEISS. The event attracted a number of experts from both academia and industry, who came to share their experiences, insights, and the latest applications of electron microscopy.
The following presentations were delivered:
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Zeiss UltraPlus at the Faculty of Mechanical Engineering, BUT – Experiences and Applications
doc. Ing. Vít Jan, Ph.D. – Brno University of Technology (BUT) -
Correlative Multi-Scale Microscopy and In-situ Automated Electron Microscopy Experiments
Ing. Ivana Burianová – ZEISS -
Applications of Electron Microscopy in Materials Research at TUL
Ing. Pavel Kejzlar, Ph.D. – Technical University of Liberec (TUL) -
ZEISS Crossbeam: Enabling High-End Microscopy and Analytics Workflows
Dr. Kirill A. Atlasov – ZEISS
